Document ID:	MIL-HDBK-279       Scroll down to access document images

Overview

Title:  Total Dose Hardness Assurance Guideline for Semiconductor Device and Microcircuit (S/S by MIL-HDBK-814) Scope:  The scope of this document is limited to total-dose radiation effects on electronic piece parts. It does not address overall system hardness assurance activities. However, occasionally, specific system requirements may be briefly addressed when it facilitates the discussion. Status:  Canceled Cancellation Date:  20-DEC-2001       FSC/Area:  59GP Doc Category:   Defense Handbook

Responsibilities

Lead Standardization Activity:  CC  DLA Weapons Support (Columbus)     Preparing Activity: CC  DLA Weapons Support (Columbus) Coordination:  Full   Army Custodian:  CR   US Army Combat Capabilities Development Command, C5ISR Center   Navy Custodian:  EC   Naval Information Warfare Systems Command   Air Force Custodian:  85   Air Force Life Cycle Management Center - Electronic Components, Wire and Ca   DLA Custodian:  CC   DLA Weapons Support (Columbus)   Other Custodian:  NA   National Aeronautics and Space Administration (NASA)

Changes to military standards or handbooks issued after August 1, 2003 are incorporated in the modified document.

Revision History

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