Document ID:	MIL-STD-750       Scroll down to access document images

Overview

Title:  Test Methods for Semiconductor Devices Scope:  This standard establishes uniform methods and procedures for testing semiconductor devices suitable for use within Military and Aerospace electronic systems. The methods and procedures in the various parts of this standard cover basic environmental, physical, and electrical tests to determine resistance to deleterious effects of natural elements and conditions surrounding military and space operations. For the purpose of this standard, the term "devices" includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related parts. This standard is intended to apply only to semiconductor devices. The test methods and procedures described in the various parts of this multipart test method standard have been prepared to serve several purposes:  a.  To specify suitable conditions obtainable in the laboratory that give test results equivalent to the actual service conditions existing in the field and to obtain reproducibility of the results of tests. The test methods described by this standard are not to be interpreted as an exact and conclusive representation of actual service operation in any one geographic location since it is known that the only true test for operation in a specific location is an actual service test at that point. b.  To describe, in a series of standards, all of the test methods of a similar character which now appear in the various joint-services semiconductor device specifications so that these test methods may be kept uniform and thus result in conservation of equipment, man-hours, and testing facilities. In achieving this objective, it is necessary to make each of the general test methods adaptable to a broad range of devices.  c. The test methods described by this standard for environmental, physical, and electrical testing of semiconductor devices also apply, when applicable, to devices not covered by an approved military sheet-form standard, specification sheet, or drawing. Status:  Active Document Date:  01-APR-2021         Next Review Due:  31-MAR-2026 FSC/Area:  5961 Doc Category:   Military Standard -Test Method Standard

Responsibilities

Lead Standardization Activity:  CC  DLA Land and Maritime     Preparing Activity: CC  DLA Land and Maritime Coordination:  Full   Army Custodian:  CR   US Army Combat Capabilities Development Command, C5ISR Center   Navy Custodian:  SH   Naval Sea Systems Command (Ship Systems)   Air Force Custodian:  85   Air Force Life Cycle Management Center - Electronic Components, Wire and Ca   DLA Custodian:  CC   DLA Land and Maritime   Other Custodian:  NA   National Aeronautics and Space Administration (NASA)

Changes to military standards or handbooks issued after August 1, 2003 are incorporated in the modified document.

Revision History

Click on column headings for a description of column content.

NOTE: It is recommended that you use Adobe Reader v7.0 or higher for optimal download performance; older versions should continue to work, but downloading large files may appear to take longer, so please be patient in those cases.