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Document ID:
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DI-SESS-82334
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Overview
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Title:
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Built-in-Test Measurement Summary (BMS)
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Scope:
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The Built-In-Test (BIT) Measurement Summary (BMS) provides the Government the measurement requirements of the system, subsystem, or equipment, as well as the accuracy of the BIT equipment and sensors that are installed to assure traceability of all measurements through an unbroken chain of comparisons. The summary identifies and validates the adequacy of the selected BIT equipment and sensors. Where the BIT processing software is used to improve the accuracy of Pass or Fail decisions, the details of that algorithm, as well as its effectiveness, are documented in this summary.
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Status:
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Active
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DID Date:
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26-FEB-2026
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Next Review Due:
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25-FEB-2031
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FSC/Area:
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SESS
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Doc Category:
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Data Item Description
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Revision History
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Click on column headings for a description of column content.
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 | Notice 2 - Validation | A | 26-FEB-2026 | 1 | 12.7 KB |
| Notice 1 - Validation | A | 22-DEC-2025 | 1 | 1.8 KB |
| Base Document | A | 21-DEC-2020 | 17 | 645.6 KB |
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