Document ID:	MIL-STD-883       Scroll down to access document images
Sub/Part:	2

Overview

Title:  Mechanical Test Methods for Microcircuits Part 2: Test Methods 2000-2999 Scope:  Part 2 of this test method standard establishes uniform test methods for the mechanical testing to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this standard, the term "devices" includes such items as monolithic, multichip, film and hybrid microcircuits, microcircuit arrays, and the elements from which the circuits and arrays are formed. This standard is intended to apply only to microelectronic devices. Status:  Active Document Date:  12-JAN-2022         Next Review Due:  11-JAN-2027 FSC/Area:  5962 Doc Category:   Military Standard -Test Method Standard

Responsibilities

Lead Standardization Activity:  CC  DLA Weapons Support (Columbus)     Preparing Activity: CC  DLA Weapons Support (Columbus) Coordination:  Full   Army Custodian:  CR   US Army Combat Capabilities Development Command, C5ISR Center   Navy Custodian:  EC   Naval Information Warfare Systems Command   Air Force Custodian:  85   Air Force Life Cycle Management Center - Electronic Components, Wire and Ca   DLA Custodian:  CC   DLA Weapons Support (Columbus)   Other Custodian:  NA   National Aeronautics and Space Administration (NASA)

Projects

Project Number:     5962-2025-005

Changes to military standards or handbooks issued after August 1, 2003 are incorporated in the modified document.

Revision History

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