Document ID:	MIL-PRF-32516       Scroll down to access document images

Overview

Title:  Electronic Test Equipment, Intermittent Fault Diagnostic (Electrical) Scope:  This specification covers the minimum performance requirements for equipment to detect and isolate nanosecond, microsecond, and millisecond intermittent faults (see 6.5.10), which can occur in conductive paths (see 6.5.2). Conductive paths include Line Replaceable Unit (LRU)/Weapon Replaceable Assembly (WRA) (see 6.5.12 and 6.5.19) chassis and backplane circuits and their wire harnesses; weapon system Electrical Wiring Interconnect System (EWIS) (see 6.5.4 and 6.5.20); and patch cables, electronic test cables and their connectors. This specification is not intended to address hard opens (see 6.5.14), shorts (see 6.5.16), nor constant function failures found in routine electronics repair. Status:  Active Document Date:  04-AUG-2022         Next Review Due:  03-AUG-2027 FSC/Area:  6625 Doc Category:   Performance Specification

Responsibilities

Lead Standardization Activity:  MI  Combat Capabilities Development Command, Aviation and Missile Center     Preparing Activity: AS  Naval Air Systems Command Coordination:  Full   Army Custodian:  MI   Combat Capabilities Development Command, Aviation and Missile Center   Navy Custodian:  AS   Naval Air Systems Command   Air Force Custodian:  184   Air Force Life Cycle Management Center, Warner Robins

Amendments to military specifications or specification sheets issued after August 1, 2003 are incorporated in the modified document.

Revision History

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