Document ID:	MIL-STD-750       Scroll down to access document images
Sub/Part:	5

Overview

Title:  High Reliability Space Application Test Methods for Semiconductor Devices Part 5: Test Methods 5000 Through 5999 Scope:  Part 5 of this test method standard establishes uniform test methods for the basic high reliability space application testing of semiconductor devices to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this standard, the term "devices" includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related parts. This part of a multipart test method standard is intended to apply only to semiconductor devices. Status:  Active Document Date:  10-AUG-2018         Next Review Due:  07-AUG-2028 FSC/Area:  5961 Doc Category:   Military Standard -Test Method Standard

Responsibilities

Lead Standardization Activity:  CC  DLA Land and Maritime     Preparing Activity: CC  DLA Land and Maritime Coordination:  Full   Army Custodian:  CR   US Army Combat Capabilities Development Command, C5ISR Center   Navy Custodian:  SH   Naval Sea Systems Command (Ship Systems)   Air Force Custodian:  85   Air Force Life Cycle Management Center - Electronic Components, Wire and Ca   DLA Custodian:  CC   DLA Land and Maritime   Other Custodian:  NA   National Aeronautics and Space Administration (NASA)

Changes to military standards or handbooks issued after August 1, 2003 are incorporated in the modified document.

Revision History

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