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   Data updated: 12 Jan 2026. Home |  About Quick Search |  ASSIST |  ASSIST Updates Document Details
Document ID:   MIL-STD-750       Scroll down to access document images
Sub/Part:  2

Overview
Title:  Mechanical Test Methods for Semiconductor Devices Part 2: Test Methods 2001 Through 2999
Scope:  Part 2 of this test method standard establishes uniform test methods for the mechanical testing of semiconductor devices to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this standard, the term "devices" includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related devices. This part of a multipart test method standard is intended to apply only to semiconductor devices.
Status:  Active Document Date:  31-JAN-2025      
  Next Review Due:  30-JAN-2030
5961 Doc Category:   Military Standard -Test Method Standard  

Responsibilities
Lead Standardization Activity:  CC  DLA Land and Maritime  
  Preparing Activity: CC  DLA Land and Maritime
Coordination:  Full  
Army Custodian:  CR   US Army Combat Capabilities Development Command, C5ISR Center  
Navy Custodian:  SH   Naval Sea Systems Command (Ship Systems)  
Air Force Custodian:  85   Air Force Life Cycle Management Center - Electronic Components, Wire and Ca  
DLA Custodian:  CC   DLA Land and Maritime  
Other Custodian:  NA   National Aeronautics and Space Administration (NASA)  

Changes to military standards or handbooks issued after August 1, 2003 are incorporated in the modified document.
Revision History Click on column headings for a description of column content.
MediaDocument Part DescriptionDist StmtDocument DatePagesSize
Document ImageRevision B Change Notice 3 A31-JAN-202533314682.1 KB
Document ImageRevision B Change 2 (all previous changes incorporated)A09-SEP-202433314779.5 KB
Document ImageRevision B Change 1 (change incorporated)A23-JUN-202332915138.3 KB
Document ImageRevision B A22-JUN-202233115457.3 KB
Document ImageRevision A Change 5 (all previous changes incorporated)A04-MAR-202133110193.2 KB
Document ImageRevision A Change 4 (all previous changes incorporated)A29-FEB-202032910432.5 KB
Document ImageRevision A Change 3 (all previous changes incorporated)A07-FEB-20183039327.1 KB
Document ImageRevision A Change 2 (all previous changes incorporated)A19-AUG-20163016611.9 KB
Document ImageRevision A Change 1 (change incorporated)A24-DEC-20153019235.9 KB
Document ImageRevision A (all previous amendments incorporated)A23-JAN-201530114495.0 KB
Document ImageChange 5 (all previous changes incorporated)A02-MAY-20142969166.4 KB
Document ImageChange 4 (all previous changes incorporated)A01-SEP-20132959077.2 KB
Document ImageChange 3 (all previous changes incorporated)A29-APR-20132958879.8 KB
Document ImageChange 2 (all previous changes incorporated)A23-NOV-20122928038.9 KB
Document ImageChange 1 (change incorporated)A25-JUN-20122868938.0 KB
Document ImageBase Document A03-JAN-20122838988.5 KB

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