Document ID:	MIL-PRF-19500       Scroll down to access document images
Spec/Std Sheet:	741

Overview

Title:  Transistor, Die, Field Effect, Radiation Hardened (Total Dose and Single Event Effects) N-Channel and P-Channel, Silicon, Various Types, JANHC and JANKC Scope:  This specification covers the performance requirements for N-channel and P-channel, enhancement-mode, MOSFET, radiation hardened (total dose and single event effects (SEE)), power transistor die. Two levels of product assurance (JANHC and JANKC) are provided for each device type as specified in MIL-PRF-19500. Provisions for radiation hardness assurance (RHA) to four radiation levels ("G", "H", "R" and "F") are provided for JANTXV and JANS product assurance levels. Status:  Active Document Date:  13-NOV-2025         Next Review Due:  12-NOV-2030 FSC/Area:  5961 Doc Category:   Performance Specification   QPL/QML:  QML-19500-31 NOT 1

Responsibilities

Lead Standardization Activity:  CC  DLA Land and Maritime     Preparing Activity: CC  DLA Land and Maritime Coordination:  Full   Army Custodian:  CR   US Army Combat Capabilities Development Command, C5ISR Center   Navy Custodian:  SH   Naval Sea Systems Command (Ship Systems)   Air Force Custodian:  85   Air Force Life Cycle Management Center - Electronic Components, Wire and Ca   DLA Custodian:  CC   DLA Land and Maritime   Other Custodian:  NA   National Aeronautics and Space Administration (NASA)

Projects

Project Number:     5961-2025-098

Amendments to military specifications or specification sheets issued after August 1, 2003 are incorporated in the modified document.

Revision History

Click on column headings for a description of column content.

NOTE: It is recommended that you use Adobe Reader v7.0 or higher for optimal download performance; older versions should continue to work, but downloading large files may appear to take longer, so please be patient in those cases.