Document ID:	EIA364.23       Scroll down to access document images

Overview

Title:  Low Level Contact Resistance Test Procedure for Electrical Connectors and Sockets (S/S by EIA-364-23) Scope:  This test procedure may apply to any type or combination of current carrying members such as pin and socket contacts, realy contacts, wire and crimp connectors, or printed circuit board and contact. Status:  Withdrawn Withdrawal Date:  13-SEP-2011       FSC/Area:  5935 Doc Category:   Electronic Industries Association (EIA)

Responsibilities

Lead Standardization Activity:  CC  DLA Land and Maritime     Adopting Activity: CC  DLA Land and Maritime Coordination:  Full   Army Custodian:  CR   US Army Combat Capabilities Development Command, C5ISR Center   Navy Custodian:  AS   Naval Air Systems Command   Air Force Custodian:  85   Air Force Life Cycle Management Center - Electronic Components, Wire and Ca   DLA Custodian:  CC   DLA Land and Maritime

Revision History

Click on column headings for a description of column content.

NOTE: It is recommended that you use Adobe Reader v7.0 or higher for optimal download performance; older versions should continue to work, but downloading large files may appear to take longer, so please be patient in those cases.