Document ID:	EIA469       Scroll down to access document images

Overview

Title:  Standard Test Method for Destructive Physical Analysis (DPA) of Ceramic Monolithic Capacitors Scope:  This document provides terminology, suggested methods, and criteria for characterizing the internal structural features of monolithic, ceramic dielectric capacitors. Its major objective is the accurate evaluation of the internal physical quality of the chip capacitor element as it relates to the functional reliability of the finished capacitor. This Standard also provides needed and useful information pertaining to activities associated with destructive physical analysis (DPA), such as visual inspection and DPA reporting. In addition, it provides tutorial help for problems inherent in DPA sample processing Status:  Active Adoption Date:  09-MAR-2012         Next Review Due:  27-FEB-2032 FSC/Area:  5910 Doc Category:   Electronic Industries Association (EIA)   Reaffirmation Date:  01-MAR-2022

Responsibilities

Lead Standardization Activity:  CC  DLA Land and Maritime     Adopting Activity: CC  DLA Land and Maritime Coordination:  Full   Navy Custodian:  EC   Naval Information Warfare Systems Command   Air Force Custodian:  85   Air Force Life Cycle Management Center - Electronic Components, Wire and Ca   DLA Custodian:  CC   DLA Land and Maritime   Other Custodian:  NA   National Aeronautics and Space Administration (NASA)

Revision History

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