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Overview
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Title:
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Semiconductor Device, Diode, Silicon, Voltage-Reference, Temperature Compensated, Types 1N4565A Through 1N4584A, Leaded and Surface Mount Packages and Unencapsulated Die, Quality Levels JAN, JANTX, JANTXV, JANS, JANHC, and JANKC, Radiation Hardened (Total Dose Only)
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Scope:
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This specification covers the performance requirements for 6.4 volts ±5 percent, silicon, low bias current, temperature compensated, voltage-reference diodes. Four levels of product assurance (JAN, JANTX, JANTXV, and JANS) are provided for each encapsulated device type as specified in MIL-PRF-19500, and two levels of product assurance for each unencapsulated device type die. Seven levels of radiation hardened (total dose only) assurance are provided for quality levels JANTXV, JANS, JANHC and JANKC as specified in MIL-PRF-19500.
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Status:
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Active
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Document Date:
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07-FEB-2024
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Next Review Due:
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05-FEB-2029
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FSC/Area:
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5961
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Doc Category:
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Performance Specification
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QPL/QML:
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QML-19500-31 NOT 1
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Amendments to military specifications or specification sheets issued after August 1, 2003 are incorporated in the modified document.
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Revision History
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Click on column headings for a description of column content.
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 | Revision K Amendment 1 | A | 07-FEB-2024 | 27 | 556.0 KB |
 | Revision K | A | 29-JAN-2019 | 27 | 501.9 KB |
 | Revision J Notice 1 - Validation | A | 17-JAN-2017 | 1 | 2.2 KB |
 | Revision J Amendment 1 (amendment incorporated) | A | 08-MAR-2012 | 22 | 279.1 KB |
 | Revision J | A | 04-FEB-2009 | 21 | 168.9 KB |
 | Revision H | A | 26-MAR-2008 | 21 | 202.4 KB |
 | Revision G | A | 01-JUL-2004 | 21 | 962.6 KB |
 | Revision F | A | 18-SEP-2003 | 22 | 80.8 KB |
 | Revision E | A | 13-MAY-1999 | 20 | 119.1 KB |
 | Revision D Amendment 1 | A | 21-JUN-1998 | 1 | 6.5 KB |
 | Revision D | A | 01-OCT-1997 | 21 | 68.3 KB |
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