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Overview
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Title:
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Transistor, N-Channel, Field Effect, Power Radiation Hardened, Silicon, Encapsulated (Through-Hole and Surface Mount Packages), Types 2N7261 and 2N7262, JANTXVR, F, G, and H and JANSR, F, G, and H
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Scope:
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This specification covers the performance requirements for an N-channel, enhancement-mode, MOSFET, radiation hardened (total dose and single event effects (SEE)) and non-hardened, power transistors. Two levels of product assurance (JANTXV and JANS) are provided for each encapsulated device with avalanche energy maximum rating (EAS) and maximum avalanche current (IAS). Provisions for radiation hardness assurance (RHA) to four radiation levels (“R”, “F”, “G”, and “H”) are provided for JANTXV and JANS product assurance levels. See 6.7 for JANHC and JANKC die versions.
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Status:
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Active
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Document Date:
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15-FEB-2022
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Next Review Due:
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14-FEB-2027
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FSC/Area:
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5961
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Doc Category:
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Performance Specification
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QPL/QML:
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QML-19500-31 NOT 1
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Amendments to military specifications or specification sheets issued after August 1, 2003 are incorporated in the modified document.
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Revision History
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Click on column headings for a description of column content.
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 | Revision L Amendment 1 (amendment incorporated) | A | 15-FEB-2022 | 29 | 530.8 KB |
 | Revision L | A | 23-MAY-2016 | 28 | 346.8 KB |
 | Revision K | A | 17-APR-2013 | 27 | 324.7 KB |
 | Revision J | A | 14-MAR-2012 | 25 | 291.1 KB |
 | Revision H | A | 10-JUN-2011 | 24 | 237.4 KB |
 | Revision G | A | 05-JUL-2006 | 24 | 138.2 KB |
 | Revision F | A | 16-NOV-2004 | 24 | 142.2 KB |
 | Revision E | A | 19-AUG-2003 | 25 | 126.8 KB |
 | Revision D | A | 17-JUL-2001 | 24 | 124.3 KB |
 | Revision C | A | 12-OCT-1997 | 22 | 148.5 KB |
 | Revision B | A | 06-JUN-1997 | 21 | 961.6 KB |
 | Revision A | A | 21-JAN-1994 | 20 | 1228.5 KB |
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