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Document ID:   MIL-STD-883       Scroll down to access document images

Overview
Title:  Microcircuits
Scope:  This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic environmental tests to determine resistance to deleterious effects of natural elements and conditions surrounding military and space operations; mechanical and electrical tests; workmanship and training procedures; and such other controls and constraints as have been deemed┬ánecessary to ensure a uniform level of quality and reliability suitable to the intended applications of those devices. For the purpose of this standard, the term "devices" includes such items as monolithic, multichip, film and hybrid microcircuits, microcircuit arrays, and the elements from which the circuits and arrays are formed. This standard is intended to apply only to microelectronic devices. The test methods, controls, and procedures described herein have been prepared to serve several purposes: a. To specify suitable conditions obtainable in the laboratory and at the device level which give test results equivalent to the actual service conditions existing in the field, and to obtain reproducibility of the results of tests.The tests described herein are not to be interpreted as an exact and conclusive representation of actual service operation in any one geographic or outer space location, since it is known that the only true test for operation in a specific application and location is an actual service test under the same conditions. b. To describe in one standard all of the test methods of a similar character which now appear in the various joint-services and NASA microelectronic device specifications, so that these methods may be kept uniform and thus result in conservation of equipment, manhours, and testing facilities. In achieving this objective, it is necessary to make each of the general tests adaptable to a broad range of devices. c. To provide for a level of uniformity of physical, electrical a...
Status:  Active Document Date:  20-JUL-2016      
  Next Review Due:  19-JUL-2021
5962 Doc Category:   Military Standard -Test Method Standard Dist Stmt:   See below

Responsibilities
Lead Standardization Activity:  CC  DLA Land and Maritime  
  Preparing Activity: CC  DLA Land and Maritime
Coordination:  Full  
Army Custodian:  CR   US Army Communications Electronics Command  
Navy Custodian:  EC   Space and Naval Warfare Systems Command  
Air Force Custodian:  85   Air Force Life Cycle Management Center - Electronic Components, Wire and Ca  
DLA Custodian:  CC   DLA Land and Maritime  
Other Custodian:  NA   National Aeronautics and Space Administration (NASA)  

Projects
 Project Number:     5962-2016-009

Changes to military standards or handbooks issued after August 1, 2003 are incorporated in the modified document.
Revision History Click on column headings for a description of column content.
MediaDocument Part DescriptionDist StmtDocument DatePagesSize
Document ImageRevision K Change 1 (change incorporated)A20-JUL-20167717436.5 KB
Document ImageRevision K A25-APR-20167657400.9 KB
Document ImageRevision J Change 5 (all previous changes incorporated)A01-JUN-20157576938.0 KB
Document ImageRevision J Change 4 (all previous changes incorporated)A03-JUL-20147636300.3 KB
Document ImageRevision J Change 3 (all previous changes incorporated)A20-JUN-20147636155.7 KB
Document ImageRevision J Change 2 (all previous changes incorporated)A14-MAR-20147596135.0 KB
Document ImageRevision J Change 1 (change incorporated)A07-NOV-20137596134.7 KB
Document ImageRevision J A07-JUN-20137556085.1 KB
Document ImageRevision H A26-FEB-20107295657.4 KB
Document ImageRevision G A28-FEB-20067166006.8 KB
Document ImageRevision F A18-JUN-20047084405.1 KB
Document ImageRevision E Change Notice 5 A30-SEP-200338233.7 KB
Document ImageRevision E Change Notice 4 A18-DEC-200031165.1 KB
Document ImageRevision E Change Notice 3 A05-NOV-199927176.8 KB
Document ImageRevision E Change Notice 2 A24-AUG-199829183.9 KB
Document ImageRevision E Change Notice 1 A01-DEC-1997331208.8 KB
Document ImageRevision E A31-DEC-199670543371.5 KB

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