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   Data updated: 20 Nov 2018. Home |  About Quick Search |  ASSIST |  ASSIST Updates Document Details

Document ID:   MIL-STD-750       Scroll down to access document images
Sub/Part:  1

Overview
Title:  Environmental Test Methods for Semiconductor Devices Part 1: Test Methods 1000 Through 1999
Scope:  Part 1 of this test method standard establishes uniform test methods for the basic environmental testing of semiconductor devices to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this test method standard, the term "devices" includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related parts. This part of a multipart test method standard is intended to apply only to semiconductor devices.
Status:  Active Document Date:  12-AUG-2016      
  Next Review Due:  11-AUG-2021
5961 Doc Category:   Military Standard -Test Method Standard  

Responsibilities
Lead Standardization Activity:  CC  DLA Land and Maritime  
  Preparing Activity: CC  DLA Land and Maritime
Coordination:  Full  
Army Custodian:  CR   US Army Communications Electronics Command  
Navy Custodian:  EC   Space and Naval Warfare Systems Command  
Air Force Custodian:  85   Air Force Life Cycle Management Center - Electronic Components, Wire and Ca  
DLA Custodian:  CC   DLA Land and Maritime  
Other Custodian:  NA   National Aeronautics and Space Administration (NASA)  

Changes to military standards or handbooks issued after August 1, 2003 are incorporated in the modified document.
Revision History Click on column headings for a description of column content.
MediaDocument Part DescriptionDist StmtDocument DatePagesSize
Document ImageRevision A Change 2 (all previous changes incorporated)A12-AUG-20161771437.3 KB
Document ImageRevision A Change (all previous changes incorporated)A13-MAY-20161771192.9 KB
Document ImageRevision A (all previous amendments incorporated)A11-DEC-20151771253.1 KB
Document ImageChange 5 (all previous changes incorporated)A24-APR-20151761249.2 KB
Document ImageChange 4 (all previous changes incorporated)A22-AUG-20141761914.5 KB
Document ImageChange 3 (all previous changes incorporated)A01-OCT-20131721369.1 KB
Document ImageChange 2 (all previous changes incorporated)A01-JUL-20131761361.7 KB
Document ImageChange 1 (change incorporated)A11-MAR-20131711359.4 KB
Document ImageBase Document A03-JAN-20121671358.2 KB

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